Overlay Process Engineer, Metrology

Our vision is to transform how the world uses information to enrich life for all. Micron Technology is a world leader in innovating memory and storage solutions that accelerate the transformation of information into intelligence, inspiring the world to learn, communicate and advance faster than ever.JR40692 Overlay Process Engineer, MetrologyAs an Overlay Process Engineer you will be primarily responsible for starting up, developing and optimizing Metrology processes to improve product quality and reliability, working on process yield improvement, cost reduction, productivity improvement and risk management as well as resolving manufacturing line problems.Meet the process engineer requirements above, you will also be required to identify, diagnose and resolve assembly process related problems by applying failure analysis, FMEA, 8D or SPC/FDC methodology. Additional responsibilities include coordinating and carrying out process, equipment and material evaluation/optimization to implement changes at process step, leading and participating in yield improvement and cost reduction activities, handling new process baseline qualifications and managing, auditing and liaising with material suppliers to achieve quality, cost and risk management objectives.• Identify, diagnose and resolve assembly process related problems• Coordinate and execute process, equipment and material evaluation / optimization initiatives and implement changes at process step• Lead / participate in continuous yield improvement and cost reduction activities• Validate and fan out new process baseline qualified, including new process, tools and/or materials for new product introduction• Support SPC/FDC/RMS/APC• Support site to site portability• Manage / audit material suppliers to achieve quality, cost and risk management objectives• Support internal and external audits・Semiconductor process experience and Eo1 Advanced process metrology development EX. if possible SEMCD engineer, Overlay engineer, OCD(Optical CD) measurement experienced engineers. ・Metrology usually use SEMCD(Scanning Electron Microscope for Critical Dimension) Measurement tool. OVL Registration tool, OCD tool. ・We are looking for people who are willing to take on challenges developing, and optimizing metrology processes to improve the new device.・If possible to speak Japanese even if it is broken.